Determination of impurities in niobium carbide by high-pressure acid decomposition/ICP-AES.
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چکیده
منابع مشابه
Secondary Electron Yield and AES Measurements on Oxides, Carbide and Nitride of Niobium*
-. Secondary electron yield measurements before and after Ar ion sputter cleaning were made on Nb and Nb compounds of interest for rf superconducting cavities. Total secondary electron yields (a) for primary energies 20-1500 eV were measured for solid Nb (a max = 1.3 at 300 eV), anodized NbzOs (a max = 1.2 at 300 eV) and powders of: Nb(a max = 1.0 at 400 eV), NbO (a max = 0.9 at 400 eV), NbOz (...
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Rights: © 1984 American Physical Society (APS). This is the accepted version of the following article: Manninen, M. & Puska, M. J. & Nieminen, Risto M. & Jena, P. 1984. Electronically induced trapping of hydrogen by impurities in niobium. Physical Review B. Volume 30, Issue 2. 1065-1068. ISSN 1550-235X (electronic). DOI: 10.1103/physrevb.30.1065, which has been published in final form at http:/...
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ژورنال
عنوان ژورنال: BUNSEKI KAGAKU
سال: 2000
ISSN: 0525-1931
DOI: 10.2116/bunsekikagaku.49.765